A42MX09-FPQG100

Microsemi Corporation A42MX09-FPQG100 technical specifications, attributes, parameters and parts with similar specifications to Microsemi Corporation A42MX09-FPQG100.


  • Manufacturer: Microchip Technology
  • NO: feilidi-A42MX09-FPQG100
  • Package: VQFP100
  • Datasheet: -
  • Stock: 2500
  • Description: Microsemi Corporation A42MX09-FPQG100 technical specifications, attributes, parameters and parts with similar specifications to Microsemi Corporation A42MX09-FPQG100.(Kg)

Qty

Unit Price

Ext Price

  • 10

    $381.13

    $3,811.25

  • 100

    $359.55

    $35,955.20

  • 500

    $339.20

    $169,600.00

  • 1000

    $320.00

    $320,000.00

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SPECIFICATIONS

Parameters

Microsemi’s automotive-grade MX families provide a high-performance, single-chip solution for

shortening the system design and development cycle, offering a cost-effective alternative to ASICs for incabin telematics and automobile interconnect applications. The 40MX and 42MX devices are excellent

choices for integrating logic that is currently implemented in multiple PALs, CPLDs, and FPGAs.

The MX device architecture is based on Microsemi’s patented antifuse technology implemented in a

0.45µm triple-metal CMOS process. With capacities ranging from 3,000 to 54,000 system gates, the MX

devices are live on power-up and have one-fifth the standby power consumption of comparable FPGAs.

MX FPGAs provide up to 202 user I/Os and are available in a wide variety of packages and speed

grades.

The automotive-grade 42MX24 and 42MX36 include system-level features such as IEEE Standard

1149.1 (JTAG) Boundary Scan Testing and fast wide-decode modules. In addition, the A42MX36 device

offers dual-port SRAM for implementing fast FIFOs, LIFOs, and temporary data storage. The storage

elements can efficiently address applications requiring wide datapath manipulation.

Features

High Capacity

• Single-Chip ASIC Alternative for Automotive

Applications

• 3,000 to 54,000 System Gates

• Up to 2.5 kbits Configurable Dual-Port SRAM

• Fast Wide-Decode Circuitry

• Up to 202 User-Programmable I/O Pins

Ease of Integration

• Up to 100% Resource Utilization and 100% Pin Locking

• Deterministic, User-Controllable Timing

• Unique In-System Diagnostic and Verification Capability

with Silicon Explorer II

• Low Power Consumption

• IEEE Standard 1149.1 (JTAG) Boundary Scan Testing


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